Improving Transition Delay Test Using a Hybrid Method September/October 2006 (vol. 23 no. 5) pp. 402-412
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2006.127
Structured delay test using scan transition tests is becoming commonplace. But high coverage and compact tests can still be elusive in some situations. The authors propose a novel technique combining the cost-effectiveness of launch-from-capture test with the coverage/pattern volume advantages of launch-from-shift.
Index Terms:
delay testing, launch-off-capture, test quality
Citation:
Nisar Ahmed, Mohammad Tehranipoor, "Improving Transition Delay Test Using a Hybrid Method," IEEE Design and Test of Computers, vol. 23, no. 5, pp. 402-412, Sep./Oct. 2006, doi:10.1109/MDT.2006.127 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||