Impact of Thermal Gradients on Clock Skew and Testing

Design&Test
2006
Issue No. 5 - September/October
Abstract - Impact of Thermal Gradients on Clock Skew and Testing

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September/October 2006 (vol. 23 no. 5)

pp. 414-424

	ASCII Text	x
	Sebasti? A. Bota, Josep L. Rossell?, Carol de Benito, Ali Keshavarzi, Jaume Segura, "Impact of Thermal Gradients on Clock Skew and Testing," IEEE Design and Test of Computers, vol. 23, no. 5, pp. 414-424, September/October, 2006.

	BibTex	x
	@article{ 10.1109/MDT.2006.126, author = {Sebasti? A. Bota and Josep L. Rossell? and Carol de Benito and Ali Keshavarzi and Jaume Segura}, title = {Impact of Thermal Gradients on Clock Skew and Testing}, journal ={IEEE Design and Test of Computers}, volume = {23}, number = {5}, issn = {0740-7475}, year = {2006}, pages = {414-424}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2006.126}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - Impact of Thermal Gradients on Clock Skew and Testing IS - 5 SN - 0740-7475 SP414 EP424 EPD - 414-424 A1 - Sebasti? A. Bota, A1 - Josep L. Rossell?, A1 - Carol de Benito, A1 - Ali Keshavarzi, A1 - Jaume Segura, PY - 2006 KW - clock skew KW - clock distribution network KW - temperature KW - interconnect delay VL - 23 JA - IEEE Design and Test of Computers ER -

Sebasti? A. Bota, University of the Balearic Islands

Josep L. Rossell?, University of the Balearic Islands

Carol de Benito, University of the Balearic Islands

Ali Keshavarzi, Intel

Jaume Segura, University of the Balearic Islands

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2006.126

It is a well-known phenomenon that test-mode switching activity and power consumption can exceed that of mission mode. Thus, testing can induce localized heating and temperature gradients with deleterious results. The authors quantify this problem and propose a novel design scheme to circumvent it.

Index Terms:

clock skew, clock distribution network, temperature, interconnect delay

Citation:

Sebasti? A. Bota, Josep L. Rossell?, Carol de Benito, Ali Keshavarzi, Jaume Segura, "Impact of Thermal Gradients on Clock Skew and Testing," IEEE Design and Test of Computers, vol. 23, no. 5, pp. 414-424, Sep./Oct. 2006, doi:10.1109/MDT.2006.126

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