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September/October 2006 (vol. 23 no. 5)
pp. 388-389
ASCII Text
x 
 
Kenneth M. Butler, "Guest Editor's Introduction: ITC Helps Get More Out of Test," IEEE Design and Test of Computers, vol. 23, no. 5, pp. 388-389, September/October, 2006.
 
 
BibTex
x
 
@article{ 10.1109/MDT.2006.120,
author = {Kenneth M. Butler},
title = {Guest Editor's Introduction: ITC Helps Get More Out of Test},
journal ={IEEE Design and Test of Computers},
volume = {23},
number = {5},
issn = {0740-7475},
year = {2006},
pages = {388-389},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2006.120},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Guest Editor's Introduction: ITC Helps Get More Out of Test
IS - 5
SN - 0740-7475
SP388
EP389
EPD - 388-389
A1 - Kenneth M. Butler,
PY - 2006
KW - International Test Conference
KW - test
VL - 23
JA - IEEE Design and Test of Computers
ER -
 
Kenneth M. Butler, Texas Instruments
This special section, along with the International Test Conference 2006, highlights the value that test adds to the electronics manufacturing business. It leads us to think about test in a whole new way.
Index Terms:
International Test Conference, test
Citation:
Kenneth M. Butler, "Guest Editor's Introduction: ITC Helps Get More Out of Test," IEEE Design and Test of Computers, vol. 23, no. 5, pp. 388-389, Sep./Oct. 2006, doi:10.1109/MDT.2006.120
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