Getting More out of ITC

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September/October 2006 (vol. 23 no. 5)

pp. 432

	ASCII Text	x
	Anne Gattiker, "Getting More out of ITC," IEEE Design and Test of Computers, vol. 23, no. 5, pp. 432, September/October, 2006.

	BibTex	x
	@article{ 10.1109/MDT.2006.119, author = {Anne Gattiker}, title = {Getting More out of ITC}, journal ={IEEE Design and Test of Computers}, volume = {23}, number = {5}, issn = {0740-7475}, year = {2006}, pages = {432}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2006.119}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - Getting More out of ITC IS - 5 SN - 0740-7475 SP EP EPD - 432 A1 - Anne Gattiker, PY - 2006 KW - International Test Conference VL - 23 JA - IEEE Design and Test of Computers ER -

Anne Gattiker, IBM Austin Research Lab

A look at plans for the 2006 International Test Conference.

Index Terms:

International Test Conference

Citation:

Anne Gattiker, "Getting More out of ITC," IEEE Design and Test of Computers, vol. 23, no. 5, pp. 432, Sep./Oct. 2006, doi:10.1109/MDT.2006.119

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