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Extracting Defect Density and Size Distributions from Product ICs
September/October 2006 (vol. 23 no. 5)
pp. 390-400
ASCII Text
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Jeffrey E. Nelson, Thomas Zanon, Jason G. Brown, Osei Poku, R.D. (Shawn) Blanton, Wojciech Maly, Brady Benware, Chris Schuermyer, "Extracting Defect Density and Size Distributions from Product ICs," IEEE Design and Test of Computers, vol. 23, no. 5, pp. 390-400, September/October, 2006.
 
 
BibTex
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@article{ 10.1109/MDT.2006.117,
author = {Jeffrey E. Nelson and Thomas Zanon and Jason G. Brown and Osei Poku and R.D. (Shawn) Blanton and Wojciech Maly and Brady Benware and Chris Schuermyer},
title = {Extracting Defect Density and Size Distributions from Product ICs},
journal ={IEEE Design and Test of Computers},
volume = {23},
number = {5},
issn = {0740-7475},
year = {2006},
pages = {390-400},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2006.117},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Extracting Defect Density and Size Distributions from Product ICs
IS - 5
SN - 0740-7475
SP390
EP400
EPD - 390-400
A1 - Jeffrey E. Nelson,
A1 - Thomas Zanon,
A1 - Jason G. Brown,
A1 - Osei Poku,
A1 - R.D. (Shawn) Blanton,
A1 - Wojciech Maly,
A1 - Brady Benware,
A1 - Chris Schuermyer,
PY - 2006
KW - defect density
KW - size distributions
KW - product IC
VL - 23
JA - IEEE Design and Test of Computers
ER -
 
Jeffrey E. Nelson, Carnegie Mellon University
Thomas Zanon, Carnegie Mellon University
Jason G. Brown, Carnegie Mellon University
Osei Poku, Carnegie Mellon University
R.D. (Shawn) Blanton, Carnegie Mellon University
Wojciech Maly, Carnegie Mellon University
Brady Benware, LSI Logic
Chris Schuermyer, LSI Logic
Defect density and size distributions are difficult to characterize, especially if you have little or no access to test vehicles specifically designed for the purpose. The authors propose a new methodology for extracting that information directly from production test data on actual products.
Index Terms:
defect density, size distributions, product IC
Citation:
Jeffrey E. Nelson, Thomas Zanon, Jason G. Brown, Osei Poku, R.D. (Shawn) Blanton, Wojciech Maly, Brady Benware, Chris Schuermyer, "Extracting Defect Density and Size Distributions from Product ICs," IEEE Design and Test of Computers, vol. 23, no. 5, pp. 390-400, Sep./Oct. 2006, doi:10.1109/MDT.2006.117
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