Extracting Defect Density and Size Distributions from Product ICs

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September/October 2006 (vol. 23 no. 5)

pp. 390-400

	ASCII Text	x
	Jeffrey E. Nelson, Thomas Zanon, Jason G. Brown, Osei Poku, R.D. (Shawn) Blanton, Wojciech Maly, Brady Benware, Chris Schuermyer, "Extracting Defect Density and Size Distributions from Product ICs," IEEE Design and Test of Computers, vol. 23, no. 5, pp. 390-400, September/October, 2006.

	BibTex	x
	@article{ 10.1109/MDT.2006.117, author = {Jeffrey E. Nelson and Thomas Zanon and Jason G. Brown and Osei Poku and R.D. (Shawn) Blanton and Wojciech Maly and Brady Benware and Chris Schuermyer}, title = {Extracting Defect Density and Size Distributions from Product ICs}, journal ={IEEE Design and Test of Computers}, volume = {23}, number = {5}, issn = {0740-7475}, year = {2006}, pages = {390-400}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2006.117}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - Extracting Defect Density and Size Distributions from Product ICs IS - 5 SN - 0740-7475 SP390 EP400 EPD - 390-400 A1 - Jeffrey E. Nelson, A1 - Thomas Zanon, A1 - Jason G. Brown, A1 - Osei Poku, A1 - R.D. (Shawn) Blanton, A1 - Wojciech Maly, A1 - Brady Benware, A1 - Chris Schuermyer, PY - 2006 KW - defect density KW - size distributions KW - product IC VL - 23 JA - IEEE Design and Test of Computers ER -

Jeffrey E. Nelson, Carnegie Mellon University

Thomas Zanon, Carnegie Mellon University

Jason G. Brown, Carnegie Mellon University

Osei Poku, Carnegie Mellon University

R.D. (Shawn) Blanton, Carnegie Mellon University

Wojciech Maly, Carnegie Mellon University

Brady Benware, LSI Logic

Chris Schuermyer, LSI Logic

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2006.117

Defect density and size distributions are difficult to characterize, especially if you have little or no access to test vehicles specifically designed for the purpose. The authors propose a new methodology for extracting that information directly from production test data on actual products.

Index Terms:

defect density, size distributions, product IC

Citation:

Jeffrey E. Nelson, Thomas Zanon, Jason G. Brown, Osei Poku, R.D. (Shawn) Blanton, Wojciech Maly, Brady Benware, Chris Schuermyer, "Extracting Defect Density and Size Distributions from Product ICs," IEEE Design and Test of Computers, vol. 23, no. 5, pp. 390-400, Sep./Oct. 2006, doi:10.1109/MDT.2006.117

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