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Survey of Test Vector Compression Techniques
July/August 2006 (vol. 23 no. 4)
pp. 294-303
ASCII Text
x 
 
Nur A. Touba, "Survey of Test Vector Compression Techniques," IEEE Design and Test of Computers, vol. 23, no. 4, pp. 294-303, July/August, 2006.
 
 
BibTex
x
 
@article{ 10.1109/MDT.2006.105,
author = {Nur A. Touba},
title = {Survey of Test Vector Compression Techniques},
journal ={IEEE Design and Test of Computers},
volume = {23},
number = {4},
issn = {0740-7475},
year = {2006},
pages = {294-303},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2006.105},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Survey of Test Vector Compression Techniques
IS - 4
SN - 0740-7475
SP294
EP303
EPD - 294-303
A1 - Nur A. Touba,
PY - 2006
KW - Test Vector Compression
VL - 23
JA - IEEE Design and Test of Computers
ER -
 
Nur A. Touba, University of Texas at Austin
Test data compression consists of test vector compression on the input side and response compaction on the output side. Test vector compression has been an active area of research, yielding a wide variety of techniques. This article summarizes and categorizes these techniques, explaining how they relate to one another. The goal is to provide a framework for understanding the theory and research in this area.
Index Terms:
Test Vector Compression
Citation:
Nur A. Touba, "Survey of Test Vector Compression Techniques," IEEE Design and Test of Computers, vol. 23, no. 4, pp. 294-303, July/Aug. 2006, doi:10.1109/MDT.2006.105
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