New ECC for Crosstalk Impact Minimization

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	Similar Articles Articles by Daniele Rossi Articles by Andr? K. Nieuwland Articles by Atul Katoch Articles by Cecilia Metra

July/August 2005 (vol. 22 no. 4)

pp. 340-348

	ASCII Text	x
	Daniele Rossi, Andr? K. Nieuwland, Atul Katoch, Cecilia Metra, "New ECC for Crosstalk Impact Minimization," IEEE Design and Test of Computers, vol. 22, no. 4, pp. 340-348, July/August, 2005.

	BibTex	x
	@article{ 10.1109/MDT.2005.91, author = {Daniele Rossi and Andr? K. Nieuwland and Atul Katoch and Cecilia Metra}, title = {New ECC for Crosstalk Impact Minimization}, journal ={IEEE Design and Test of Computers}, volume = {22}, number = {4}, issn = {0740-7475}, year = {2005}, pages = {340-348}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2005.91}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - New ECC for Crosstalk Impact Minimization IS - 4 SN - 0740-7475 SP340 EP348 EPD - 340-348 A1 - Daniele Rossi, A1 - Andr? K. Nieuwland, A1 - Atul Katoch, A1 - Cecilia Metra, PY - 2005 KW - Reliability KW - Fault Tolerance KW - Error Correcting Codes KW - Crosstalk KW - Signal Integrity VL - 22 JA - IEEE Design and Test of Computers ER -

Daniele Rossi, University of Bologna

Andr? K. Nieuwland, Philips Research Laboratories

Atul Katoch, Philips Research Laboratories

Cecilia Metra, University of Bologna

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2005.91

Signal integrity in high-speed bus designs is put at risk by crosstalk-related bus delays. This article provides a comprehensive study of the usefulness of error-correcting code (ECC) redundancy in reducing such delays. It shows that Dual Rail codes perform better at this task than Hamming codes.

Index Terms:

Reliability, Fault Tolerance, Error Correcting Codes, Crosstalk, Signal Integrity

Citation:

Daniele Rossi, Andr? K. Nieuwland, Atul Katoch, Cecilia Metra, "New ECC for Crosstalk Impact Minimization," IEEE Design and Test of Computers, vol. 22, no. 4, pp. 340-348, July/Aug. 2005, doi:10.1109/MDT.2005.91

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