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July/August 2005 (vol. 22 no. 4)
pp. 295-297
ASCII Text
x 
 
R. Iris Bahar, Mehdi B. Tahoori, Sandeep K. Shukla, Fabrizio Lombardi, "Guest Editors' Introduction: Challenges for Reliable Design at the Nanoscale," IEEE Design and Test of Computers, vol. 22, no. 4, pp. 295-297, July/August, 2005.
 
 
BibTex
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@article{ 10.1109/MDT.2005.84,
author = {R. Iris Bahar and Mehdi B. Tahoori and Sandeep K. Shukla and Fabrizio Lombardi},
title = {Guest Editors' Introduction: Challenges for Reliable Design at the Nanoscale},
journal ={IEEE Design and Test of Computers},
volume = {22},
number = {4},
issn = {0740-7475},
year = {2005},
pages = {295-297},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2005.84},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Guest Editors' Introduction: Challenges for Reliable Design at the Nanoscale
IS - 4
SN - 0740-7475
SP295
EP297
EPD - 295-297
A1 - R. Iris Bahar,
A1 - Mehdi B. Tahoori,
A1 - Sandeep K. Shukla,
A1 - Fabrizio Lombardi,
PY - 2005
KW - nanoscale design
KW - defect rates
KW - reliability
KW - redundancy
KW - Moore's Law
KW - verification
VL - 22
JA - IEEE Design and Test of Computers
ER -
 
R. Iris Bahar, Brown University
Mehdi B. Tahoori, Northeastern University
Sandeep K. Shukla, Virginia Tech
Fabrizio Lombardi, Northeastern University
This special issue contains four articles to covering techniques and applications for the reliable design of nanoscale systems; the techniques aim to circumvent the high defect rates and transient errors expected in advanced nanoscale technologies. As nanostructured materials with unreliable and defective substrates begin to enter the mainstream of computer design, engineers must overcome the challenges of reliability, optimal redundancy, coding precision, validation in the presence of uncertainty, and verification.
Index Terms:
nanoscale design, defect rates, reliability, redundancy, Moore's Law, verification
Citation:
R. Iris Bahar, Mehdi B. Tahoori, Sandeep K. Shukla, Fabrizio Lombardi, "Guest Editors' Introduction: Challenges for Reliable Design at the Nanoscale," IEEE Design and Test of Computers, vol. 22, no. 4, pp. 295-297, July/Aug. 2005, doi:10.1109/MDT.2005.84
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