A Reconfiguration-Based Defect-Tolerant Design Paradigm for Nanotechnologies

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July/August 2005 (vol. 22 no. 4)

pp. 316-326

	ASCII Text	x
	Chen He, Margarida F. Jacome, Gustavo de Veciana, "A Reconfiguration-Based Defect-Tolerant Design Paradigm for Nanotechnologies," IEEE Design and Test of Computers, vol. 22, no. 4, pp. 316-326, July/August, 2005.

	BibTex	x
	@article{ 10.1109/MDT.2005.76, author = {Chen He and Margarida F. Jacome and Gustavo de Veciana}, title = {A Reconfiguration-Based Defect-Tolerant Design Paradigm for Nanotechnologies}, journal ={IEEE Design and Test of Computers}, volume = {22}, number = {4}, issn = {0740-7475}, year = {2005}, pages = {316-326}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2005.76}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - A Reconfiguration-Based Defect-Tolerant Design Paradigm for Nanotechnologies IS - 4 SN - 0740-7475 SP316 EP326 EPD - 316-326 A1 - Chen He, A1 - Margarida F. Jacome, A1 - Gustavo de Veciana, PY - 2005 KW - Nanotechnologies KW - probabilistic design KW - defect tolerance KW - reconfiguration VL - 22 JA - IEEE Design and Test of Computers ER -

Chen He, University of Texas at Austin and Freescale Semiconductor Inc.

Margarida F. Jacome, University of Texas at Austin

Gustavo de Veciana, University of Texas at Austin

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2005.76

To address the density, scalability, and reliability challenges of emerging nanotechnologies, the authors propose a hierarchy of design abstractions, constructed as reconfigurable fabric regions, whereby designers assign small functional flows to each region. The approach exposes a new class of yield, delay, and cost trade-offs that must be jointly considered when designing computing systems in defect-prone nanotechnologies.

Index Terms:

Nanotechnologies, probabilistic design, defect tolerance, reconfiguration

Citation:

Chen He, Margarida F. Jacome, Gustavo de Veciana, "A Reconfiguration-Based Defect-Tolerant Design Paradigm for Nanotechnologies," IEEE Design and Test of Computers, vol. 22, no. 4, pp. 316-326, July/Aug. 2005, doi:10.1109/MDT.2005.76

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