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May/June 2005 (vol. 22 no. 3)
pp. 200-205
ASCII Text
x 
 
Juan-Antonio Carballo, Yervant Zorian, Raul Camposano, Andrzej J. Strojwas, John K. Kibarian, Dennis Wassung, Alex Alexanian, Steve Wigley, Neil Kelly, "Guest Editors' Introduction: DFM Drives Changes in Design Flow," IEEE Design and Test of Computers, vol. 22, no. 3, pp. 200-205, May/June, 2005.
 
 
BibTex
x
 
@article{ 10.1109/MDT.2005.61,
author = {Juan-Antonio Carballo and Yervant Zorian and Raul Camposano and Andrzej J. Strojwas and John K. Kibarian and Dennis Wassung and Alex Alexanian and Steve Wigley and Neil Kelly},
title = {Guest Editors' Introduction: DFM Drives Changes in Design Flow},
journal ={IEEE Design and Test of Computers},
volume = {22},
number = {3},
issn = {0740-7475},
year = {2005},
pages = {200-205},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2005.61},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Guest Editors' Introduction: DFM Drives Changes in Design Flow
IS - 3
SN - 0740-7475
SP200
EP205
EPD - 200-205
A1 - Juan-Antonio Carballo,
A1 - Yervant Zorian,
A1 - Raul Camposano,
A1 - Andrzej J. Strojwas,
A1 - John K. Kibarian,
A1 - Dennis Wassung,
A1 - Alex Alexanian,
A1 - Steve Wigley,
A1 - Neil Kelly,
PY - 2005
KW - Design for manufacturability
KW - DFM
VL - 22
JA - IEEE Design and Test of Computers
ER -
 
Yervant Zorian, Virage Logic
Raul Camposano, Synopsys
Andrzej J. Strojwas, PDF Solutions Inc.
John K. Kibarian, PDF Solutions Inc.
Dennis Wassung, Adams Harkness Inc.
Alex Alexanian, Pont? Solutions Inc.
Steve Wigley, LTX Corp.
Neil Kelly, LTX Corp.
Design for manufacturability (DFM) has thus far been the focus of extensive study in the semiconductor industry. Although deep-submicron processes enable the manufacture of area-efficient, high-performance chips, navigating the nanometer landscape presents enormous manufacturability challenges.
Index Terms:
Design for manufacturability, DFM
Citation:
Juan-Antonio Carballo, Yervant Zorian, Raul Camposano, Andrzej J. Strojwas, John K. Kibarian, Dennis Wassung, Alex Alexanian, Steve Wigley, Neil Kelly, "Guest Editors' Introduction: DFM Drives Changes in Design Flow," IEEE Design and Test of Computers, vol. 22, no. 3, pp. 200-205, May/June 2005, doi:10.1109/MDT.2005.61
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