Using a Periodic Square Wave Test Signal to Detect Crosstalk Faults March/April 2005 (vol. 22 no. 2) pp. 160-169
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2005.49
This BIST scheme simplifies the detection of crosstalk faults in deep-submicron VLSI circuits in the boundary scan environment. Simulation results show that with just a few random patterns, fault coverage for most large benchmark circuits can exceed 90%.
Citation:
Ming Shae Wu, Chung Len Lee, "Using a Periodic Square Wave Test Signal to Detect Crosstalk Faults," IEEE Design and Test of Computers, vol. 22, no. 2, pp. 160-169, Mar./Apr. 2005, doi:10.1109/MDT.2005.49 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||