Testing: It's not just pass/fail anymore

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January/February 2005 (vol. 22 no. 1)

pp. 80

	ASCII Text	x
	Scott Davidson, "Testing: It's not just pass/fail anymore," IEEE Design and Test of Computers, vol. 22, no. 1, pp. 80, January/February, 2005.

	BibTex	x
	@article{ 10.1109/MDT.2005.22, author = {Scott Davidson}, title = {Testing: It's not just pass/fail anymore}, journal ={IEEE Design and Test of Computers}, volume = {22}, number = {1}, issn = {0740-7475}, year = {2005}, pages = {80}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2005.22}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - Testing: It's not just pass/fail anymore IS - 1 SN - 0740-7475 SP EP EPD - 80 A1 - Scott Davidson, PY - 2005 VL - 22 JA - IEEE Design and Test of Computers ER -

Scott Davidson, Sun Microsystems

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2005.22

Citation:

Scott Davidson, "Testing: It's not just pass/fail anymore," IEEE Design and Test of Computers, vol. 22, no. 1, pp. 80, Jan./Feb. 2005, doi:10.1109/MDT.2005.22

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