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Testing: It's not just pass/fail anymore
January/February 2005 (vol. 22 no. 1)
pp. 80
ASCII Text
x 
 
Scott Davidson, "Testing: It's not just pass/fail anymore," IEEE Design and Test of Computers, vol. 22, no. 1, pp. 80, January/February, 2005.
 
 
BibTex
x
 
@article{ 10.1109/MDT.2005.22,
author = {Scott Davidson},
title = {Testing: It's not just pass/fail anymore},
journal ={IEEE Design and Test of Computers},
volume = {22},
number = {1},
issn = {0740-7475},
year = {2005},
pages = {80},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2005.22},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Testing: It's not just pass/fail anymore
IS - 1
SN - 0740-7475
SP
EP
EPD - 80
A1 - Scott Davidson,
PY - 2005
VL - 22
JA - IEEE Design and Test of Computers
ER -
 
Scott Davidson, Sun Microsystems
Citation:
Scott Davidson, "Testing: It's not just pass/fail anymore," IEEE Design and Test of Computers, vol. 22, no. 1, pp. 80, Jan./Feb. 2005, doi:10.1109/MDT.2005.22
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