Exploiting ECC Redundancy to Minimize Crosstalk Impact

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	Similar Articles Articles by Daniele Rossi Articles by Andr? K. Nieuwland Articles by Atul Katoch Articles by Cecilia Metra

January/February 2005 (vol. 22 no. 1)

pp. 59-70

	ASCII Text	x
	Daniele Rossi, Andr? K. Nieuwland, Atul Katoch, Cecilia Metra, "Exploiting ECC Redundancy to Minimize Crosstalk Impact," IEEE Design and Test of Computers, vol. 22, no. 1, pp. 59-70, January/February, 2005.

	BibTex	x
	@article{ 10.1109/MDT.2005.10, author = {Daniele Rossi and Andr? K. Nieuwland and Atul Katoch and Cecilia Metra}, title = {Exploiting ECC Redundancy to Minimize Crosstalk Impact}, journal ={IEEE Design and Test of Computers}, volume = {22}, number = {1}, issn = {0740-7475}, year = {2005}, pages = {59-70}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2005.10}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - Exploiting ECC Redundancy to Minimize Crosstalk Impact IS - 1 SN - 0740-7475 SP59 EP70 EPD - 59-70 A1 - Daniele Rossi, A1 - Andr? K. Nieuwland, A1 - Atul Katoch, A1 - Cecilia Metra, PY - 2005 VL - 22 JA - IEEE Design and Test of Computers ER -

Daniele Rossi, University of Bologna

Andr? K. Nieuwland, Philips Research Laboratories

Atul Katoch, Philips Research Laboratories

Cecilia Metra, University of Bologna

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2005.10

Editors' note: Signal integrity in high-speed bus designs is put at risk by crosstalk-related bus delays. This article provides a comprehensive study of the usefulness of error-correcting code (ECC) redundancy in reducing such delays. It shows that Dual Rail codes perform better at this task than Hamming codes.

—Dimitris Gizopoulos, University of Piraeus; and Yervant Zorian, Virage Logic

Citation:

Daniele Rossi, Andr? K. Nieuwland, Atul Katoch, Cecilia Metra, "Exploiting ECC Redundancy to Minimize Crosstalk Impact," IEEE Design and Test of Computers, vol. 22, no. 1, pp. 59-70, Jan./Feb. 2005, doi:10.1109/MDT.2005.10

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