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On-Chip Self-Calibrating Communication Techniques Robust to Electrical Parameter Variations
November/December 2004 (vol. 21 no. 6)
pp. 524-535
ASCII Text
x 
 
Fr?d?ric Worm, Paolo Ienne, Patrick Thiran, Giovanni De Micheli, "On-Chip Self-Calibrating Communication Techniques Robust to Electrical Parameter Variations," IEEE Design and Test of Computers, vol. 21, no. 6, pp. 524-535, November/December, 2004.
 
 
BibTex
x
 
@article{ 10.1109/MDT.2004.96,
author = {Fr?d?ric Worm and Paolo Ienne and Patrick Thiran and Giovanni De Micheli},
title = {On-Chip Self-Calibrating Communication Techniques Robust to Electrical Parameter Variations},
journal ={IEEE Design and Test of Computers},
volume = {21},
number = {6},
issn = {0740-7475},
year = {2004},
pages = {524-535},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2004.96},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - On-Chip Self-Calibrating Communication Techniques Robust to Electrical Parameter Variations
IS - 6
SN - 0740-7475
SP524
EP535
EPD - 524-535
A1 - Fr?d?ric Worm,
A1 - Paolo Ienne,
A1 - Patrick Thiran,
A1 - Giovanni De Micheli,
PY - 2004
VL - 21
JA - IEEE Design and Test of Computers
ER -
 
Fr?d?ric Worm, Swiss Federal Institute of Technology Lausanne
Paolo Ienne, Swiss Federal Institute of Technology Lausanne
Patrick Thiran, Swiss Federal Institute of Technology Lausanne
Giovanni De Micheli, Stanford University
Editor's note: Dynamic self-calibration holds the promise of overcoming conservative worst-case design techniques needed to combat deep-submicron process and operating variations. This article proposes an on-chip point-to-point interconnect scheme characterized by self-calibration that can operate dynamically to achieve the best energy/performance trade-off. —Soha Hassoun, Tufts University
Citation:
Fr?d?ric Worm, Paolo Ienne, Patrick Thiran, Giovanni De Micheli, "On-Chip Self-Calibrating Communication Techniques Robust to Electrical Parameter Variations," IEEE Design and Test of Computers, vol. 21, no. 6, pp. 524-535, Nov./Dec. 2004, doi:10.1109/MDT.2004.96
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