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Defect and Error Tolerance in the Presence of Massive Numbers of Defects
May/June 2004 (vol. 21 no. 3)
pp. 216-227
ASCII Text
x 
 
Melvin A. Breuer, Sandeep K. Gupta, T.M. Mak, "Defect and Error Tolerance in the Presence of Massive Numbers of Defects," IEEE Design and Test of Computers, vol. 21, no. 3, pp. 216-227, May/June, 2004.
 
 
BibTex
x
 
@article{ 10.1109/MDT.2004.8,
author = {Melvin A. Breuer and Sandeep K. Gupta and T.M. Mak},
title = {Defect and Error Tolerance in the Presence of Massive Numbers of Defects},
journal ={IEEE Design and Test of Computers},
volume = {21},
number = {3},
issn = {0740-7475},
year = {2004},
pages = {216-227},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2004.8},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Defect and Error Tolerance in the Presence of Massive Numbers of Defects
IS - 3
SN - 0740-7475
SP216
EP227
EPD - 216-227
A1 - Melvin A. Breuer,
A1 - Sandeep K. Gupta,
A1 - T.M. Mak,
PY - 2004
VL - 21
JA - IEEE Design and Test of Computers
ER -
 
Melvin A. Breuer, University of Southern California
Sandeep K. Gupta, University of Southern California
T.M. Mak, Intel
As scaling approaches the physical limits of devices, we will continue to see increasing levels of process variations, noise, and defect densities. Many applications today can tolerate certain levels of errors resulting from such factors. This article introduces a new approach for error tolerance resulting in chips containing only errors acceptable for such applications.
Citation:
Melvin A. Breuer, Sandeep K. Gupta, T.M. Mak, "Defect and Error Tolerance in the Presence of Massive Numbers of Defects," IEEE Design and Test of Computers, vol. 21, no. 3, pp. 216-227, May/June 2004, doi:10.1109/MDT.2004.8
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