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September/October 2004 (vol. 21 no. 5)
pp. 448-449
ASCII Text
x 
 
Scott Davidson, "A practical look at ATPG," IEEE Design and Test of Computers, vol. 21, no. 5, pp. 448-449, September/October, 2004.
 
 
BibTex
x
 
@article{ 10.1109/MDT.2004.44,
author = {Scott Davidson},
title = {A practical look at ATPG},
journal ={IEEE Design and Test of Computers},
volume = {21},
number = {5},
issn = {0740-7475},
year = {2004},
pages = {448-449},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2004.44},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - A practical look at ATPG
IS - 5
SN - 0740-7475
SP448
EP449
EPD - 448-449
A1 - Scott Davidson,
PY - 2004
VL - 21
JA - IEEE Design and Test of Computers
ER -
 
Scott Davidson, Sun Microsystems
Book Reviewed: Digital Logic Testing and Simulation, 2nd edition, by Alexander Miczo (Wiley-Interscience, 2003, ISBN 0-471-43995-9, 696 pp., $115).
Citation:
Scott Davidson, "A practical look at ATPG," IEEE Design and Test of Computers, vol. 21, no. 5, pp. 448-449, Sep./Oct. 2004, doi:10.1109/MDT.2004.44
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