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Multiplexing ATE Channels for Production Testing at 2.5 Gbps
July/August 2004 (vol. 21 no. 4)
pp. 288-301
ASCII Text
x 
 
David C. Keezer, Dany Minier, Marie-Christine Caron, "Multiplexing ATE Channels for Production Testing at 2.5 Gbps," IEEE Design and Test of Computers, vol. 21, no. 4, pp. 288-301, July/August, 2004.
 
 
BibTex
x
 
@article{ 10.1109/MDT.2004.37,
author = {David C. Keezer and Dany Minier and Marie-Christine Caron},
title = {Multiplexing ATE Channels for Production Testing at 2.5 Gbps},
journal ={IEEE Design and Test of Computers},
volume = {21},
number = {4},
issn = {0740-7475},
year = {2004},
pages = {288-301},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2004.37},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Multiplexing ATE Channels for Production Testing at 2.5 Gbps
IS - 4
SN - 0740-7475
SP288
EP301
EPD - 288-301
A1 - David C. Keezer,
A1 - Dany Minier,
A1 - Marie-Christine Caron,
PY - 2004
VL - 21
JA - IEEE Design and Test of Computers
ER -
 
David C. Keezer, Georgia Institute of Technology
Dany Minier, IBM Canada
For industry, volume-production-stage testing of multigigahertz ICs poses economic challenges that are at least as significant as the associated technical challenges. Here, the authors address both issues by describing a practical solution based on the retrofit of conventional ATE resources to allow accurate testing of ICs with many channels. Their system can test ICs at 2.5 Gbps over 144 channels, with extensions planned that will have test rates exceeding 5 Gbps.
Citation:
David C. Keezer, Dany Minier, Marie-Christine Caron, "Multiplexing ATE Channels for Production Testing at 2.5 Gbps," IEEE Design and Test of Computers, vol. 21, no. 4, pp. 288-301, July/Aug. 2004, doi:10.1109/MDT.2004.37
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