loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Embedded Deterministic Test for Low-Cost Manufacturing
September/October 2003 (vol. 20 no. 5)
pp. 58-66
ASCII Text
x 
 
Janusz Rajski, Mark Kassab, Nilanjan Mukherjee, Nagesh Tamarapalli, Jerzy Tyszer, Jun Qian, "Embedded Deterministic Test for Low-Cost Manufacturing," IEEE Design and Test of Computers, vol. 20, no. 5, pp. 58-66, September/October, 2003.
 
 
BibTex
x
 
@article{ 10.1109/MDT.2003.1232257,
author = {Janusz Rajski and Mark Kassab and Nilanjan Mukherjee and Nagesh Tamarapalli and Jerzy Tyszer and Jun Qian},
title = {Embedded Deterministic Test for Low-Cost Manufacturing},
journal ={IEEE Design and Test of Computers},
volume = {20},
number = {5},
issn = {0740-7475},
year = {2003},
pages = {58-66},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2003.1232257},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Embedded Deterministic Test for Low-Cost Manufacturing
IS - 5
SN - 0740-7475
SP58
EP66
EPD - 58-66
A1 - Janusz Rajski,
A1 - Mark Kassab,
A1 - Nilanjan Mukherjee,
A1 - Nagesh Tamarapalli,
A1 - Jerzy Tyszer,
A1 - Jun Qian,
PY - 2003
VL - 20
JA - IEEE Design and Test of Computers
ER -
 
Janusz Rajski, Mentor Graphics
Mark Kassab, Mentor Graphics
Nilanjan Mukherjee, Mentor Graphics
Nagesh Tamarapalli, Mentor Graphics
Jerzy Tyszer, Poznan University of Technology
Jun Qian, Cisco Systems

Editor's note:
You have probably heard that BIST takes too long and its fault coverage is low, and that deterministic test requires too many patterns. This article shows how on-chip compression and decompression techniques can provide high fault coverage with low test times.
—Rob Aitken, Artisan Components

Citation:
Janusz Rajski, Mark Kassab, Nilanjan Mukherjee, Nagesh Tamarapalli, Jerzy Tyszer, Jun Qian, "Embedded Deterministic Test for Low-Cost Manufacturing," IEEE Design and Test of Computers, vol. 20, no. 5, pp. 58-66, Sep./Oct. 2003, doi:10.1109/MDT.2003.1232257
Usage of this product signifies your acceptance of the Terms of Use.