Minimizing Pattern Count for Interconnect Test under a Ground Bounce Constraint

Design&Test
2003
Issue No. 2 - March/April
Abstract - Minimizing Pattern Count for Interconnect Test under a Ground Bounce Constraint

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	Similar Articles Articles by Erik Jan Marinissen Articles by Bart Vermeulen Articles by Henk Hollmann Articles by R.G.(Ben) Bennetts

March/April 2003 (vol. 20 no. 2)

pp. 8-18

	ASCII Text	x
	Erik Jan Marinissen, Bart Vermeulen, Henk Hollmann, R.G.(Ben) Bennetts, "Minimizing Pattern Count for Interconnect Test under a Ground Bounce Constraint," IEEE Design and Test of Computers, vol. 20, no. 2, pp. 8-18, March/April, 2003.

	BibTex	x
	@article{ 10.1109/MDT.2003.1188257, author = {Erik Jan Marinissen and Bart Vermeulen and Henk Hollmann and R.G.(Ben) Bennetts}, title = {Minimizing Pattern Count for Interconnect Test under a Ground Bounce Constraint}, journal ={IEEE Design and Test of Computers}, volume = {20}, number = {2}, issn = {0740-7475}, year = {2003}, pages = {8-18}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2003.1188257}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - Minimizing Pattern Count for Interconnect Test under a Ground Bounce Constraint IS - 2 SN - 0740-7475 SP8 EP18 EPD - 8-18 A1 - Erik Jan Marinissen, A1 - Bart Vermeulen, A1 - Henk Hollmann, A1 - R.G.(Ben) Bennetts, PY - 2003 VL - 20 JA - IEEE Design and Test of Computers ER -

Erik Jan Marinissen, Philips Research Laboratories

Bart Vermeulen, Philips Research Laboratories

Henk Hollmann, Philips Research Laboratories

R.G.(Ben) Bennetts, Bennetts Associates

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2003.1188257

Editor?s note:

When testing the interconnect structures on a board, test programmers sometimes ask, How can I control the test pattern generation process to avoid ground bounce problems during Extest mode? Those wishing to satisfy a simultaneously-switching-outputs constraint will find several new solutions in this article.

--Monica Lobetti-Bodoni

Siemens Mobile Communications

Citation:

Erik Jan Marinissen, Bart Vermeulen, Henk Hollmann, R.G.(Ben) Bennetts, "Minimizing Pattern Count for Interconnect Test under a Ground Bounce Constraint," IEEE Design and Test of Computers, vol. 20, no. 2, pp. 8-18, Mar./Apr. 2003, doi:10.1109/MDT.2003.1188257

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