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Improving Defect Detection in Static-Voltage Testing
November/December 2002 (vol. 19 no. 6)
pp. 83-89
ASCII Text
x 
 
Michel Renovell, Florence Azaïs, Yves Bertrand, "Improving Defect Detection in Static-Voltage Testing," IEEE Design and Test of Computers, vol. 19, no. 6, pp. 83-89, November/December, 2002.
 
 
BibTex
x
 
@article{ 10.1109/MDT.2002.1047747,
author = {Michel Renovell and Florence Azaïs and Yves Bertrand},
title = {Improving Defect Detection in Static-Voltage Testing},
journal ={IEEE Design and Test of Computers},
volume = {19},
number = {6},
issn = {0740-7475},
year = {2002},
pages = {83-89},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2002.1047747},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Improving Defect Detection in Static-Voltage Testing
IS - 6
SN - 0740-7475
SP83
EP89
EPD - 83-89
A1 - Michel Renovell,
A1 - Florence Azaïs,
A1 - Yves Bertrand,
PY - 2002
VL - 19
JA - IEEE Design and Test of Computers
ER -
 

Analyzing defect behavior is becoming increasingly difficult with the rising significance of defects that depend on random parameters. Such unpredictable parameters can affect various types of test escape. The concept of detection domains can help sort out the behavior of these test escapes.

Citation:
Michel Renovell, Florence Azaïs, Yves Bertrand, "Improving Defect Detection in Static-Voltage Testing," IEEE Design and Test of Computers, vol. 19, no. 6, pp. 83-89, Nov./Dec. 2002, doi:10.1109/MDT.2002.1047747
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