Testing Mixed-Signal Cores: A Practical Oscillation-Based Test in an Analog Macrocell November/December 2002 (vol. 19 no. 6) pp. 73-82
A formal set of design decisions can aid in using oscillation-based test for analog subsystems in SoCs. The goal is to offer designers testing options that don?t have significant area overhead, performance degradation, or test time.
Citation:
Gloria Huertas, Diego Vázquez, Eduardo J.Peralías, Adoración Rueda, José Luis Huertas, "Testing Mixed-Signal Cores: A Practical Oscillation-Based Test in an Analog Macrocell," IEEE Design and Test of Computers, vol. 19, no. 6, pp. 73-82, Nov./Dec. 2002, doi:10.1109/MDT.2002.1047746 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||