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Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort
September/October 2002 (vol. 19 no. 5)
pp. 74-81
ASCII Text
x 
 
W. Robert Daasch, James McNames, Robert Madge, Kevin Cota, "Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort," IEEE Design and Test of Computers, vol. 19, no. 5, pp. 74-81, September/October, 2002.
 
 
BibTex
x
 
@article{ 10.1109/MDT.2002.1033795,
author = {W. Robert Daasch and James McNames and Robert Madge and Kevin Cota},
title = {Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort},
journal ={IEEE Design and Test of Computers},
volume = {19},
number = {5},
issn = {0740-7475},
year = {2002},
pages = {74-81},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2002.1033795},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort
IS - 5
SN - 0740-7475
SP74
EP81
EPD - 74-81
A1 - W. Robert Daasch,
A1 - James McNames,
A1 - Robert Madge,
A1 - Kevin Cota,
PY - 2002
VL - 19
JA - IEEE Design and Test of Computers
ER -
 

To screen defective dies, IDDQ tests require a reliable estimate of each die's defect-free measurement. The nearest-neighbor residual (NNR) method provides a straightforward, data-driven estimate of test measurements for improved identification of die outliers.

Citation:
W. Robert Daasch, James McNames, Robert Madge, Kevin Cota, "Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort," IEEE Design and Test of Computers, vol. 19, no. 5, pp. 74-81, Sep./Oct. 2002, doi:10.1109/MDT.2002.1033795
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