Carl Barnhart, Vanessa Brunkhorst, Frank Distler, Owen Farnsworth, Andrew Ferko, Brion Keller, David Scott, Bernd Koenemann, Takeshi Onodera, "Extending OPMISR beyond 10x Scan Test Efficiency," IEEE Design and Test of Computers, vol. 19, no. 5, pp. 65-72, September/October, 2002.

@article{ 10.1109/MDT.2002.1033794,
author = {Carl Barnhart and Vanessa Brunkhorst and Frank Distler and Owen Farnsworth and Andrew Ferko and Brion Keller and David Scott and Bernd Koenemann and Takeshi Onodera},
title = {Extending OPMISR beyond 10x Scan Test Efficiency},
journal ={IEEE Design and Test of Computers},
volume = {19},
number = {5},
issn = {0740-7475},
year = {2002},
pages = {65-72},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2002.1033794},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - MGZN
JO - IEEE Design and Test of Computers
TI - Extending OPMISR beyond 10x Scan Test Efficiency
IS - 5
SN - 0740-7475
SP65
EP72
EPD - 65-72
A1 - Carl Barnhart,
A1 - Vanessa Brunkhorst,
A1 - Frank Distler,
A1 - Owen Farnsworth,
A1 - Andrew Ferko,
A1 - Brion Keller,
A1 - David Scott,
A1 - Bernd Koenemann,
A1 - Takeshi Onodera,
PY - 2002
VL - 19
JA - IEEE Design and Test of Computers
ER -