"A D&T Roundtable: RF Integration into CMOS and Deep-Submicron Challenges," IEEE Design and Test of Computers, vol. 16, no. 3, pp. 112-116, July-September, 1999.

@article{ 10.1109/MDT.1999.10017,
author = {},
title = {A D&T Roundtable: RF Integration into CMOS and Deep-Submicron Challenges},
journal ={IEEE Design and Test of Computers},
volume = {16},
number = {3},
issn = {0740-7475},
year = {1999},
pages = {112-116},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.1999.10017},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - MGZN
JO - IEEE Design and Test of Computers
TI - A D&T Roundtable: RF Integration into CMOS and Deep-Submicron Challenges
IS - 3
SN - 0740-7475
SP112
EP116
EPD - 112-116
PY - 1999
VL - 16
JA - IEEE Design and Test of Computers
ER -