Multiple Fault Diagnosis by Sensitizing Input Pairs

Design&Test
1995
Issue No. 3 - Fall
Abstract - Multiple Fault Diagnosis by Sensitizing Input Pairs

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Fall 1995 (vol. 12 no. 3)

pp. 44-52

	ASCII Text	x
	Nobuhiro Yanagida, Hiroshi Takahashi, Yuzo Takamatsu, "Multiple Fault Diagnosis by Sensitizing Input Pairs," IEEE Design and Test of Computers, vol. 12, no. 3, pp. 44-52, Fall, 1995.

	BibTex	x
	@article{ 10.1109/MDT.1995.466375, author = {Nobuhiro Yanagida and Hiroshi Takahashi and Yuzo Takamatsu}, title = {Multiple Fault Diagnosis by Sensitizing Input Pairs}, journal ={IEEE Design and Test of Computers}, volume = {12}, number = {3}, issn = {0740-7475}, year = {1995}, pages = {44-52}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.1995.466375}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - Multiple Fault Diagnosis by Sensitizing Input Pairs IS - 3 SN - 0740-7475 SP44 EP52 EPD - 44-52 A1 - Nobuhiro Yanagida, A1 - Hiroshi Takahashi, A1 - Yuzo Takamatsu, PY - 1995 KW - fault diagnosis KW - multiple stuck-at faults KW - sensitizing input-pairs KW - progressive deduction KW - combinational circuits VL - 12 JA - IEEE Design and Test of Computers ER -

Nobuhiro Yanagida

Hiroshi Takahashi

Yuzo Takamatsu

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.1995.466375

This article presents an efficient method for multiple fault diagnosis of combinational circuits by sensitizing input-pairs. The diagnostic process uses five deduction rules and a progressive deduction procedure to deduce suspected multiple faults in a circuit without probing internal lines, based on the responses observed at primary outputs by sensitizing input-pairs. The authors present a detailed example to demonstrate their method and experimental results to show the efficiency of the method.

Index Terms:

fault diagnosis, multiple stuck-at faults, sensitizing input-pairs, progressive deduction, combinational circuits

Citation:

Nobuhiro Yanagida, Hiroshi Takahashi, Yuzo Takamatsu, "Multiple Fault Diagnosis by Sensitizing Input Pairs," IEEE Design and Test of Computers, vol. 12, no. 3, pp. 44-52, Sept. 1995, doi:10.1109/MDT.1995.466375

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