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Agilent's Mixed-Signal Oscilloscopes Provide Enhanced Measurement Capabilities
May/June 2001 (vol. 3 no. 3)
pp. 11-14
ASCII Text
x 
 
Douglas Tougaw, "Agilent's Mixed-Signal Oscilloscopes Provide Enhanced Measurement Capabilities," Computing in Science and Engineering, vol. 3, no. 3, pp. 11-14, May/June, 2001.
 
 
BibTex
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@article{ 10.1109/MCISE.2001.919260,
author = {Douglas Tougaw},
title = {Agilent's Mixed-Signal Oscilloscopes Provide Enhanced Measurement Capabilities},
journal ={Computing in Science and Engineering},
volume = {3},
number = {3},
issn = {1521-9615},
year = {2001},
pages = {11-14},
doi = {http://doi.ieeecomputersociety.org/10.1109/MCISE.2001.919260},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - Computing in Science and Engineering
TI - Agilent's Mixed-Signal Oscilloscopes Provide Enhanced Measurement Capabilities
IS - 3
SN - 1521-9615
SP11
EP14
EPD - 11-14
A1 - Douglas Tougaw,
PY - 2001
VL - 3
JA - Computing in Science and Engineering
ER -
 
Oscilloscopes are among the most important measurement tools available to electrical engineers, and incorporating digital technology into these tools has significantly increased their capabilities. Recently introduced mixed-signal oscilloscopes combine the functionality of traditional analog measurement with basic features of digital logic analyzers.
Citation:
Douglas Tougaw, "Agilent's Mixed-Signal Oscilloscopes Provide Enhanced Measurement Capabilities," Computing in Science and Engineering, vol. 3, no. 3, pp. 11-14, May/June 2001, doi:10.1109/MCISE.2001.919260
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