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Reliability Concerns in Embedded System Designs
January 2006 (vol. 39 no. 1)
pp. 118-120
ASCII Text
x 
 
Vijaykrishnan Narayanan, Yuan Xie, "Reliability Concerns in Embedded System Designs," Computer, vol. 39, no. 1, pp. 118-120, January, 2006.
 
 
BibTex
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@article{ 10.1109/MC.2006.31,
author = {Vijaykrishnan Narayanan and Yuan Xie},
title = {Reliability Concerns in Embedded System Designs},
journal ={Computer},
volume = {39},
number = {1},
issn = {0018-9162},
year = {2006},
pages = {118-120},
doi = {http://doi.ieeecomputersociety.org/10.1109/MC.2006.31},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - Computer
TI - Reliability Concerns in Embedded System Designs
IS - 1
SN - 0018-9162
SP118
EP120
EPD - 118-120
A1 - Vijaykrishnan Narayanan,
A1 - Yuan Xie,
PY - 2006
KW - embedded systems
KW - eystem design
VL - 39
JA - Computer
ER -
 
Vijaykrishnan Narayanan, The Pennsylvania State University
Yuan Xie, The Pennsylvania State University
Designing a dependable embedded system atop a less reliable hardware platform poses great challenges.
Index Terms:
embedded systems, eystem design
Citation:
Vijaykrishnan Narayanan, Yuan Xie, "Reliability Concerns in Embedded System Designs," Computer, vol. 39, no. 1, pp. 118-120, Jan. 2006, doi:10.1109/MC.2006.31
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