Reliability Concerns in Embedded System Designs

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January 2006 (vol. 39 no. 1)

pp. 118-120

	ASCII Text	x
	Vijaykrishnan Narayanan, Yuan Xie, "Reliability Concerns in Embedded System Designs," Computer, vol. 39, no. 1, pp. 118-120, January, 2006.

	BibTex	x
	@article{ 10.1109/MC.2006.31, author = {Vijaykrishnan Narayanan and Yuan Xie}, title = {Reliability Concerns in Embedded System Designs}, journal ={Computer}, volume = {39}, number = {1}, issn = {0018-9162}, year = {2006}, pages = {118-120}, doi = {http://doi.ieeecomputersociety.org/10.1109/MC.2006.31}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - Computer TI - Reliability Concerns in Embedded System Designs IS - 1 SN - 0018-9162 SP118 EP120 EPD - 118-120 A1 - Vijaykrishnan Narayanan, A1 - Yuan Xie, PY - 2006 KW - embedded systems KW - eystem design VL - 39 JA - Computer ER -

Vijaykrishnan Narayanan, The Pennsylvania State University

Yuan Xie, The Pennsylvania State University

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MC.2006.31

Designing a dependable embedded system atop a less reliable hardware platform poses great challenges.

Index Terms:

embedded systems, eystem design

Citation:

Vijaykrishnan Narayanan, Yuan Xie, "Reliability Concerns in Embedded System Designs," Computer, vol. 39, no. 1, pp. 118-120, Jan. 2006, doi:10.1109/MC.2006.31

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