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February 2005 (vol. 38 no. 2)
pp. 36-39
ASCII Text
x 
 
Yervant Zorian, "Nanoscale Design & Test Challenges," Computer, vol. 38, no. 2, pp. 36-39, February, 2005.
 
 
BibTex
x
 
@article{ 10.1109/MC.2005.67,
author = {Yervant Zorian},
title = {Nanoscale Design & Test Challenges},
journal ={Computer},
volume = {38},
number = {2},
issn = {0018-9162},
year = {2005},
pages = {36-39},
doi = {http://doi.ieeecomputersociety.org/10.1109/MC.2005.67},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - Computer
TI - Nanoscale Design & Test Challenges
IS - 2
SN - 0018-9162
SP36
EP39
EPD - 36-39
A1 - Yervant Zorian,
PY - 2005
KW - design and test
KW - nanotechnology
KW - design automation
VL - 38
JA - Computer
ER -
 
Yervant Zorian, Virage Logic Corp.
The silicon-scaling revolution presents a plethora of challenges as technology progresses into the nanoscale era. To meet these challenges, the design and test community has banded together to improve design automation and find solutions that will optimize performance at every level.
Index Terms:
design and test, nanotechnology, design automation
Citation:
Yervant Zorian, "Nanoscale Design & Test Challenges," Computer, vol. 38, no. 2, pp. 36-39, Feb. 2005, doi:10.1109/MC.2005.67
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