A Generic Method for Embedded Measurement and Compensation of Process and Temperature Variations in SoCs

I
IWSOC
2005
Fifth International Workshop on System-on-Chip for Real-Time Applications (IWSOC'05)
Abstract - A Generic Method for Embedded Measurement and Compensation of Process and Temperature Variations in SoCs

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	Similar Articles Articles by Hung Tien Bui Articles by Yvon Savaria

Fifth International Workshop on System-on-Chip for Real-Time Applications (IWSOC'05)

Banff, Alberta, Canada

July 20-July 24

ISBN: 0-7695-2403-6

	ASCII Text	x
	Hung Tien Bui, Yvon Savaria, "A Generic Method for Embedded Measurement and Compensation of Process and Temperature Variations in SoCs," System-on-Chip for Real-Time Applications, International Workshop on, pp. 557-562, Fifth International Workshop on System-on-Chip for Real-Time Applications (IWSOC'05), 2005.

	BibTex	x
	@article{ 10.1109/IWSOC.2005.9, author = {Hung Tien Bui and Yvon Savaria}, title = {A Generic Method for Embedded Measurement and Compensation of Process and Temperature Variations in SoCs}, journal ={System-on-Chip for Real-Time Applications, International Workshop on}, volume = {0}, year = {2005}, isbn = {0-7695-2403-6}, pages = {557-562}, doi = {http://doi.ieeecomputersociety.org/10.1109/IWSOC.2005.9}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - System-on-Chip for Real-Time Applications, International Workshop on TI - A Generic Method for Embedded Measurement and Compensation of Process and Temperature Variations in SoCs SN - 0-7695-2403-6 SP557 EP562 A1 - Hung Tien Bui, A1 - Yvon Savaria, PY - 2005 KW - null VL - 0 JA - System-on-Chip for Real-Time Applications, International Workshop on ER -

Hung Tien Bui, ?cole Polytechnique de Montr?al

Yvon Savaria, ?cole Polytechnique de Montr?al

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/IWSOC.2005.9

This paper proposes an embedded method of measuring process and temperature variations using the resulting change in transconductance of affected transistors. It also presents a compensation scheme for these variations using a generic and versatile method that can conveniently be used in system-on-chip applications. The measuring and compensating system has been applied on a 9-stage current-controlled oscillator. Differences in oscillating frequency between corner cases have been reduced from over 90 MHz to less than 10 MHz.

Citation:

Hung Tien Bui, Yvon Savaria, "A Generic Method for Embedded Measurement and Compensation of Process and Temperature Variations in SoCs," iwsoc, pp.557-562, Fifth International Workshop on System-on-Chip for Real-Time Applications (IWSOC'05), 2005

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