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Fifth International Workshop on System-on-Chip for Real-Time Applications (IWSOC'05)
Four-Valued Memory Circuit Designed by Multiple-Peak MOS-NDR Devices and Circuits
Banff, Alberta, Canada
July 20-July 24
ISBN: 0-7695-2403-6
Dong-Shong Liang, Kun Shan University of Technology
Kwang-Jow Gan, Kun Shan University of Technology
Long-Xian Su, Kun Shan University of Technology
Chi-Pin Chen, Kun Shan University of Technology
Chung-Chih Hsiao, Kun Shan University of Technology
Cher Shiung Tsai, Kun Shan University of Technology
Yaw-Hwang Chen, Kun Shan University of Technology
Shih-Yu Wang, Kun Shan University of Technology
Shun-Huo Kuo, Kun Shan University of Technology
Feng-Chang Chiang, Kun Shan University of Technology
This paper describes the design of a four-valued memory cell based on a three-peak MOS-NDR circuit. We connect three MOS-NDR devices in parallel that can create a three-peak current-voltage curve by suitably arranging the parameters. Due to its folding IV characteristics, multiple -peak NDR device is a very promising device for multiple -valued logic application. This memory cell structure can be easily extended to implement more states in a memory circuit.
Citation:
Dong-Shong Liang, Kwang-Jow Gan, Long-Xian Su, Chi-Pin Chen, Chung-Chih Hsiao, Cher Shiung Tsai, Yaw-Hwang Chen, Shih-Yu Wang, Shun-Huo Kuo, Feng-Chang Chiang, "Four-Valued Memory Circuit Designed by Multiple-Peak MOS-NDR Devices and Circuits," iwsoc, pp.78-81, Fifth International Workshop on System-on-Chip for Real-Time Applications (IWSOC'05), 2005
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