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International Test Conference 2004 (ITC'04)
IMPACT OF NEGATIVE BIAS TEMPERATURE INSTABILITY ON PRODUCT PARAMETRIC DRIFT
Charlotte, NC, USA
October 26-October 28
ISBN: 0-7803-8581-0
ASCII Text
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Vijay Reddy, John Carulli, Anand Krishnan, William Bosch, Brendan Burgess, "IMPACT OF NEGATIVE BIAS TEMPERATURE INSTABILITY ON PRODUCT PARAMETRIC DRIFT," Test Conference, International, pp. 148-155, International Test Conference 2004 (ITC'04), 2004.
 
 
BibTex
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@article{ 10.1109/ITC.2004.93,
author = {Vijay Reddy and John Carulli and Anand Krishnan and William Bosch and Brendan Burgess},
title = {IMPACT OF NEGATIVE BIAS TEMPERATURE INSTABILITY ON PRODUCT PARAMETRIC DRIFT},
journal ={Test Conference, International},
volume = {0},
year = {2004},
issn = {1089-3539},
pages = {148-155},
doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.93},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Test Conference, International
TI - IMPACT OF NEGATIVE BIAS TEMPERATURE INSTABILITY ON PRODUCT PARAMETRIC DRIFT
SN - 1089-3539
SP148
EP155
A1 - Vijay Reddy,
A1 - John Carulli,
A1 - Anand Krishnan,
A1 - William Bosch,
A1 - Brendan Burgess,
PY - 2004
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Vijay Reddy, Texas Instruments Inc.
John Carulli, Texas Instruments Inc.
Anand Krishnan, Texas Instruments Inc.
William Bosch, Texas Instruments Inc., Stafford, TX
Brendan Burgess, Texas Instruments Inc., Stafford, TX
A systematic test methodology is presented that comprehends the impact of Negative Bias Temperature Instability on product parametric drift. A test guardbanding technique to estimate parameter drift under BI and customer use conditions is given.
Citation:
Vijay Reddy, John Carulli, Anand Krishnan, William Bosch, Brendan Burgess, "IMPACT OF NEGATIVE BIAS TEMPERATURE INSTABILITY ON PRODUCT PARAMETRIC DRIFT," itc, pp.148-155, International Test Conference 2004 (ITC'04), 2004
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