I/O Self-Leakage Test

I
ITC
2004
International Test Conference 2004 (ITC'04)
Abstract - I/O Self-Leakage Test

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International Test Conference 2004 (ITC'04)

Charlotte, NC, USA

October 26-October 28

ISBN: 0-7803-8581-0

	ASCII Text	x
	Ali Muhtaroglu, Benoit Provost, Tawfik Rahal-Arabi, Greg Taylor, "I/O Self-Leakage Test," Test Conference, International, pp. 903-906, International Test Conference 2004 (ITC'04), 2004.

	BibTex	x
	@article{ 10.1109/ITC.2004.88, author = {Ali Muhtaroglu and Benoit Provost and Tawfik Rahal-Arabi and Greg Taylor}, title = {I/O Self-Leakage Test}, journal ={Test Conference, International}, volume = {0}, year = {2004}, issn = {1089-3539}, pages = {903-906}, doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.88}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - I/O Self-Leakage Test SN - 1089-3539 SP903 EP906 A1 - Ali Muhtaroglu, A1 - Benoit Provost, A1 - Tawfik Rahal-Arabi, A1 - Greg Taylor, PY - 2004 KW - null VL - 0 JA - Test Conference, International ER -

Ali Muhtaroglu, Intel Corporation, Logic Technology Development, Hillsboro, OR

Benoit Provost, Intel Corporation, Logic Technology Development, Hillsboro, OR

Tawfik Rahal-Arabi, Intel Corporation, Logic Technology Development, Hillsboro, OR

Greg Taylor, Intel Corporation, Logic Technology Development, Hillsboro, OR

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ITC.2004.88

This paper presents the implementation of the Self- Leakage Test, a new approach for unconnected I/O leakage testing. It provides a path for leakage current through the on-chip leakers and uses the voltage drop at the pad to detect a pass/fail condition. A detailed methodology for defining the self-leakage test specifications has been developed. Preliminary silicon data shows that selfleakage test methodology provide a viable method for high-volume monitoring of I/O leakage at minimal on-die DFT (Design-For-Test) overhead.

Citation:

Ali Muhtaroglu, Benoit Provost, Tawfik Rahal-Arabi, Greg Taylor, "I/O Self-Leakage Test," itc, pp.903-906, International Test Conference 2004 (ITC'04), 2004

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