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International Test Conference 2004 (ITC'04)
Charlotte, NC, USA
October 26-October 28
ISBN: 0-7803-8581-0
ASCII Text
x 
 
Edward I. Jr. Cole, "Global Failure Localization: We Have To, But on What and How?," Test Conference, International, pp. 1440, International Test Conference 2004 (ITC'04), 2004.
 
 
BibTex
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@article{ 10.1109/ITC.2004.84,
author = {Edward I. Jr. Cole},
title = {Global Failure Localization: We Have To, But on What and How?},
journal ={Test Conference, International},
volume = {0},
year = {2004},
issn = {1089-3539},
pages = {1440},
doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.84},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Test Conference, International
TI - Global Failure Localization: We Have To, But on What and How?
SN - 1089-3539
SP
EP
A1 - Edward I. Jr. Cole,
PY - 2004
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Edward I. Jr. Cole, Sandia National Laboratories Albuquerque, USA
How long can we succeed? - as long as ICs with new designs and technologies come out of wafer fab that don?t work the first time they?re implemented in silicon or have low yield - FA needs to keep succeeding. Diagnosis tells us something?s wrong and can point us in a general and in some cases specific directions, but FA will be needed to know exactly what?s wrong and customers will demand to know why. The customers? need to know is another topic, but WE need to know sometimes, quickly and correctly.
Citation:
Edward I. Jr. Cole, "Global Failure Localization: We Have To, But on What and How?," itc, pp.1440, International Test Conference 2004 (ITC'04), 2004
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