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International Test Conference 2004 (ITC'04)
Charlotte, NC, USA
October 26-October 28
ISBN: 0-7803-8581-0
ASCII Text
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Mohamed M. Hafed, "GLAMOROUS ANALOG TESTABILITY - WE ALREADY TEST THEM AND SHIP THEM - SO WHAT IS THE PROBLEM?," Test Conference, International, pp. 1416, International Test Conference 2004 (ITC'04), 2004.
 
 
BibTex
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@article{ 10.1109/ITC.2004.83,
author = {Mohamed M. Hafed},
title = {GLAMOROUS ANALOG TESTABILITY - WE ALREADY TEST THEM AND SHIP THEM - SO WHAT IS THE PROBLEM?},
journal ={Test Conference, International},
volume = {0},
year = {2004},
issn = {1089-3539},
pages = {1416},
doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.83},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Test Conference, International
TI - GLAMOROUS ANALOG TESTABILITY - WE ALREADY TEST THEM AND SHIP THEM - SO WHAT IS THE PROBLEM?
SN - 1089-3539
SP
EP
A1 - Mohamed M. Hafed,
PY - 2004
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Mohamed M. Hafed, DFT MicroSystems Canada Inc.
Despite historically being one of the first areas to benefit from automation, analog circuit test poses particular challenges to modern test technology. In fact, contemporary analog test seems to represent a niche area for which solutions are always future ones. Yet, analog circuits are being mass-produced at astounding rates (whether within more complex digital IC?s or as purely analog parts). This apparent paradox is addressed in this panel, which adopts a problem-solving approach to defining and addressing the analog test domain.
Citation:
Mohamed M. Hafed, "GLAMOROUS ANALOG TESTABILITY - WE ALREADY TEST THEM AND SHIP THEM - SO WHAT IS THE PROBLEM?," itc, pp.1416, International Test Conference 2004 (ITC'04), 2004
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