International Test Conference 2004 (ITC'04) Future Trends in Test: The Adoption and Use of Low Cost Structural Testers Charlotte, NC, USA October 26-October 28 ISBN: 0-7803-8581-0
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ITC.2004.82
become popular for various reasons. Although originally aimed at reducing production test costs, they have quickly migrated to other niches and have proven useful in reducing not only cost, but time-to-market. Tracking the "use" spaces has resulted in identifying three clearly different areas of application: design-desktop, correlationlab, and the production-test floor. These spaces have defined tasks such as characterization, first silicon bringup, test program development, yield-learning diagnosis, and production probe, some of which will be described as case studies.
Citation:
Alfred L. Crouch, "Future Trends in Test: The Adoption and Use of Low Cost Structural Testers," itc, pp.698-703, International Test Conference 2004 (ITC'04), 2004 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||