FAULT DIAGNOSIS IN DESIGNSWITH CONVOLUTIONAL COMPACTORS

I
ITC
2004
International Test Conference 2004 (ITC'04)
Abstract - FAULT DIAGNOSIS IN DESIGNSWITH CONVOLUTIONAL COMPACTORS

	This Article
	Subscribers, please Login Purchase article: $19 PDF RSS feed
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by Grzegorz Mrugalski Articles by Chen Wang Articles by Artur Pogiel Articles by Jerzy Tyszer Articles by Janusz Rajski

International Test Conference 2004 (ITC'04)

Charlotte, NC, USA

October 26-October 28

ISBN: 0-7803-8581-0

	ASCII Text	x
	Grzegorz Mrugalski, Chen Wang, Artur Pogiel, Jerzy Tyszer, Janusz Rajski, "FAULT DIAGNOSIS IN DESIGNSWITH CONVOLUTIONAL COMPACTORS," Test Conference, International, pp. 498-507, International Test Conference 2004 (ITC'04), 2004.

	BibTex	x
	@article{ 10.1109/ITC.2004.76, author = {Grzegorz Mrugalski and Chen Wang and Artur Pogiel and Jerzy Tyszer and Janusz Rajski}, title = {FAULT DIAGNOSIS IN DESIGNSWITH CONVOLUTIONAL COMPACTORS}, journal ={Test Conference, International}, volume = {0}, year = {2004}, issn = {1089-3539}, pages = {498-507}, doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.76}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - FAULT DIAGNOSIS IN DESIGNSWITH CONVOLUTIONAL COMPACTORS SN - 1089-3539 SP498 EP507 A1 - Grzegorz Mrugalski, A1 - Chen Wang, A1 - Artur Pogiel, A1 - Jerzy Tyszer, A1 - Janusz Rajski, PY - 2004 KW - null VL - 0 JA - Test Conference, International ER -

Grzegorz Mrugalski, Mentor Graphics Corporation, Wilsonville, OR

Chen Wang, Mentor Graphics Corporation, Wilsonville, OR

Artur Pogiel, Poznan University of Technology, Poland

Jerzy Tyszer, Poznan University of Technology, Poland

Janusz Rajski, Mentor Graphics Corporation, Wilsonville, OR

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ITC.2004.76

The paper introduces a new non-adaptive fault diagnosis technique for scan-based designs. The proposed scheme guarantees accurate and time-efficient identification of failing scan cells based on results of a convolutional test response compaction.

Citation:

Grzegorz Mrugalski, Chen Wang, Artur Pogiel, Jerzy Tyszer, Janusz Rajski, "FAULT DIAGNOSIS IN DESIGNSWITH CONVOLUTIONAL COMPACTORS," itc, pp.498-507, International Test Conference 2004 (ITC'04), 2004

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.