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International Test Conference 2004 (ITC'04)
Extending the Digital Core-based Test Methodology to Support Mixed-Signal
Charlotte, NC, USA
October 26-October 28
ISBN: 0-7803-8581-0
ASCII Text
x 
 
Geert Seuren, Tom Waayers, "Extending the Digital Core-based Test Methodology to Support Mixed-Signal," Test Conference, International, pp. 281-289, International Test Conference 2004 (ITC'04), 2004.
 
 
BibTex
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@article{ 10.1109/ITC.2004.75,
author = {Geert Seuren and Tom Waayers},
title = {Extending the Digital Core-based Test Methodology to Support Mixed-Signal},
journal ={Test Conference, International},
volume = {0},
year = {2004},
issn = {1089-3539},
pages = {281-289},
doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.75},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Test Conference, International
TI - Extending the Digital Core-based Test Methodology to Support Mixed-Signal
SN - 1089-3539
SP281
EP289
A1 - Geert Seuren,
A1 - Tom Waayers,
PY - 2004
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Geert Seuren, Philips Research Electronics Design, Netherlands
Tom Waayers, Philips Research Electronics Design, Netherlands
This paper presents an extension to a digital core-based test arhitecture to support testing of mixed-signal cores in a system-on-chip. It also presents a new mixed-signal test development flow that comprises a test library based approach to ease mixed-signal test development. The new flow was realized and experiments show clear advantages.
Citation:
Geert Seuren, Tom Waayers, "Extending the Digital Core-based Test Methodology to Support Mixed-Signal," itc, pp.281-289, International Test Conference 2004 (ITC'04), 2004
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