Experimental Results for High-Speed Jitter Measurement Technique

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International Test Conference 2004 (ITC'04)

Charlotte, NC, USA

October 26-October 28

ISBN: 0-7803-8581-0

	ASCII Text	x
	Karen Taylor, Bryan Nelson, Alan Chong, Hieu Nguyen, Henry Lin, Mani Soma, Hosam Haggag, Jeff Huard, Jim Braatz, "Experimental Results for High-Speed Jitter Measurement Technique," Test Conference, International, pp. 85-94, International Test Conference 2004 (ITC'04), 2004.

	BibTex	x
	@article{ 10.1109/ITC.2004.73, author = {Karen Taylor and Bryan Nelson and Alan Chong and Hieu Nguyen and Henry Lin and Mani Soma and Hosam Haggag and Jeff Huard and Jim Braatz}, title = {Experimental Results for High-Speed Jitter Measurement Technique}, journal ={Test Conference, International}, volume = {0}, year = {2004}, issn = {1089-3539}, pages = {85-94}, doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.73}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - Experimental Results for High-Speed Jitter Measurement Technique SN - 1089-3539 SP85 EP94 A1 - Karen Taylor, A1 - Bryan Nelson, A1 - Alan Chong, A1 - Hieu Nguyen, A1 - Henry Lin, A1 - Mani Soma, A1 - Hosam Haggag, A1 - Jeff Huard, A1 - Jim Braatz, PY - 2004 KW - null VL - 0 JA - Test Conference, International ER -

Karen Taylor, University of Washington, Seattle, WA

Bryan Nelson, University of Washington, Seattle, WA

Alan Chong, University of Washington, Seattle, WA

Hieu Nguyen, University of Washington, Seattle, WA

Henry Lin, University of Washington, Seattle, WA

Mani Soma, University of Washington, Seattle, WA

Hosam Haggag, Santa Clara Design Center, National Semiconductor, Santa Clara, CA

Jeff Huard, Tacoma Design Center, National Semiconductor, Federal Way, WA

Jim Braatz, Tacoma Design Center, National Semiconductor, Federal Way, WA

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ITC.2004.73

A BIST method to measure jitter without external references is presented. Measured data from 0.25-..m BiCMOS chips show jitter resolution about 30 to 50 ps over 8 cycles of a 1 GHz input signal.

Citation:

Karen Taylor, Bryan Nelson, Alan Chong, Hieu Nguyen, Henry Lin, Mani Soma, Hosam Haggag, Jeff Huard, Jim Braatz, "Experimental Results for High-Speed Jitter Measurement Technique," itc, pp.85-94, International Test Conference 2004 (ITC'04), 2004

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