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International Test Conference 2004 (ITC'04)
Charlotte, NC, USA
October 26-October 28
ISBN: 0-7803-8581-0
ASCII Text
x 
 
Robert Daasch, Manu Rehani, "Dude! Where?s my data? - Cracking Open the Hermetically Sealed Tester," Test Conference, International, pp. 1428, International Test Conference 2004 (ITC'04), 2004.
 
 
BibTex
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@article{ 10.1109/ITC.2004.65,
author = {Robert Daasch and Manu Rehani},
title = {Dude! Where?s my data? - Cracking Open the Hermetically Sealed Tester},
journal ={Test Conference, International},
volume = {0},
year = {2004},
issn = {1089-3539},
pages = {1428},
doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.65},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Test Conference, International
TI - Dude! Where?s my data? - Cracking Open the Hermetically Sealed Tester
SN - 1089-3539
SP
EP
A1 - Robert Daasch,
A1 - Manu Rehani,
PY - 2004
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Robert Daasch, Portland State University
Manu Rehani, LSI Logic Corporation, OR
ATE customers realize that testers that keep test data "hermetically sealed" in production mode are a barrier to profitability. This data is needed for Process/Yield Improvement, Adaptive Control, Product Characterization, Reliabilityimprovement / burn-in elimination, Test Floor SPC, Calibration, and Test Repeatability etc. Subcontractor and Foundry manufacturing increases the complexity of getting the data. This panel looks into why we?re here and where to go.
Citation:
Robert Daasch, Manu Rehani, "Dude! Where?s my data? - Cracking Open the Hermetically Sealed Tester," itc, pp.1428, International Test Conference 2004 (ITC'04), 2004
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