A Code-less BIST Processor for Embedded Test and in-system configuration of Boards and Systems

I
ITC
2004
International Test Conference 2004 (ITC'04)
Abstract - A Code-less BIST Processor for Embedded Test and in-system configuration of Boards and Systems

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	Similar Articles Articles by CJ Clark Articles by Mike Ricchetti

International Test Conference 2004 (ITC'04)

Charlotte, NC, USA

October 26-October 28

ISBN: 0-7803-8581-0

	ASCII Text	x
	CJ Clark, Mike Ricchetti, "A Code-less BIST Processor for Embedded Test and in-system configuration of Boards and Systems," Test Conference, International, pp. 857-866, International Test Conference 2004 (ITC'04), 2004.

	BibTex	x
	@article{ 10.1109/ITC.2004.6, author = {CJ Clark and Mike Ricchetti}, title = {A Code-less BIST Processor for Embedded Test and in-system configuration of Boards and Systems}, journal ={Test Conference, International}, volume = {0}, year = {2004}, issn = {1089-3539}, pages = {857-866}, doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.6}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - A Code-less BIST Processor for Embedded Test and in-system configuration of Boards and Systems SN - 1089-3539 SP857 EP866 A1 - CJ Clark, A1 - Mike Ricchetti, PY - 2004 KW - null VL - 0 JA - Test Conference, International ER -

CJ Clark, Intellitech Corporation, Durham, NH

Mike Ricchetti, ATI Research, Inc., Marlborough, MA

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ITC.2004.6

A code-less processor that enables designers to achieve optimal in-system FPGA configuration as well as embed built-in self-test capabilities into boards and systems is presented. This system BIST architecture enables designers to lower system costs and design effort while satisfying test and field engineering requirements for simplified product test.

Citation:

CJ Clark, Mike Ricchetti, "A Code-less BIST Processor for Embedded Test and in-system configuration of Boards and Systems," itc, pp.857-866, International Test Conference 2004 (ITC'04), 2004

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