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International Test Conference 2004 (ITC'04)
DETECTING FAULTS IN THE PERIPHERAL CIRCUITS AND AN EVALUATION OF SRAM TESTS
Charlotte, NC, USA
October 26-October 28
ISBN: 0-7803-8581-0
ASCII Text
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Ad J. Van de Goor, Said Hamdioui, Rob Wadsworth, "DETECTING FAULTS IN THE PERIPHERAL CIRCUITS AND AN EVALUATION OF SRAM TESTS," Test Conference, International, pp. 114-123, International Test Conference 2004 (ITC'04), 2004.
 
 
BibTex
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@article{ 10.1109/ITC.2004.59,
author = {Ad J. Van de Goor and Said Hamdioui and Rob Wadsworth},
title = {DETECTING FAULTS IN THE PERIPHERAL CIRCUITS AND AN EVALUATION OF SRAM TESTS},
journal ={Test Conference, International},
volume = {0},
year = {2004},
issn = {1089-3539},
pages = {114-123},
doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.59},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Test Conference, International
TI - DETECTING FAULTS IN THE PERIPHERAL CIRCUITS AND AN EVALUATION OF SRAM TESTS
SN - 1089-3539
SP114
EP123
A1 - Ad J. Van de Goor,
A1 - Said Hamdioui,
A1 - Rob Wadsworth,
PY - 2004
KW - March tests
KW - data-backgrounds
KW - address directions
KW - fault coverage
KW - peripheral circuit faults.
VL - 0
JA - Test Conference, International
ER -
 
Ad J. Van de Goor, Delft University of Technology, Netherlands
Said Hamdioui, Philips Semiconductor R&D, France
Rob Wadsworth, ST Microlelctronics, Carrollton, TX
Very little has been published on faults in the memory peripheral circuits, denoted as PFs?. This paper shows that PFs will be detected by march tests, provided that they satisfy particular properties, expressed in terms of properties of the algorithm, and of properties of the algorithm stress. The latter consists of the used data backgrounds and addressing directions. The detection capabilities of a set of well-know march algorithms will be established for the PFs. In addition, industrial results from applying this set of tests to a large number of 0.13 micron 512 Kbyte SRAM chips, combined with a variety of stress conditions, will be presented.
Index Terms:
March tests, data-backgrounds, address directions,fault coverage, peripheral circuit faults.
Citation:
Ad J. Van de Goor, Said Hamdioui, Rob Wadsworth, "DETECTING FAULTS IN THE PERIPHERAL CIRCUITS AND AN EVALUATION OF SRAM TESTS," itc, pp.114-123, International Test Conference 2004 (ITC'04), 2004
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