Data Mining Integrated Circuit Fails with Fail Commonalities

I
ITC
2004
International Test Conference 2004 (ITC'04)
Abstract - Data Mining Integrated Circuit Fails with Fail Commonalities

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International Test Conference 2004 (ITC'04)

Charlotte, NC, USA

October 26-October 28

ISBN: 0-7803-8581-0

	ASCII Text	x
	Leendert M. Huisman, Maroun Kassab, Leah Pastel, "Data Mining Integrated Circuit Fails with Fail Commonalities," Test Conference, International, pp. 661-668, International Test Conference 2004 (ITC'04), 2004.

	BibTex	x
	@article{ 10.1109/ITC.2004.54, author = {Leendert M. Huisman and Maroun Kassab and Leah Pastel}, title = {Data Mining Integrated Circuit Fails with Fail Commonalities}, journal ={Test Conference, International}, volume = {0}, year = {2004}, issn = {1089-3539}, pages = {661-668}, doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.54}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - Data Mining Integrated Circuit Fails with Fail Commonalities SN - 1089-3539 SP661 EP668 A1 - Leendert M. Huisman, A1 - Maroun Kassab, A1 - Leah Pastel, PY - 2004 KW - null VL - 0 JA - Test Conference, International ER -

Leendert M. Huisman, IBM Microelectronics, Essex Junction, VT

Maroun Kassab, IBM Microelectronics, Essex Junction, VT

Leah Pastel, IBM Microelectronics, Essex Junction, VT

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ITC.2004.54

We describe ways to use fail data from many failing Integrate Circuits (ICs) to determine which ICs failed because of similar causes, rather than to determine the cause of each individual failing IC. The purpose of finding clusters of similarly failing ICs is to focus on systematic defects, and to de-emphasize random ones. Once large groups of similarly failing ICs have been identified, a selection of the ICs in each group can be diagnosed using standard diagnostic routines.

Citation:

Leendert M. Huisman, Maroun Kassab, Leah Pastel, "Data Mining Integrated Circuit Fails with Fail Commonalities," itc, pp.661-668, International Test Conference 2004 (ITC'04), 2004

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