International Test Conference 2004 (ITC'04)
34.1Gbps Low Jitter, Low BER High-Speed Parallel CMOS Interface for Interconnections in High-Speed Memory Test System
Charlotte, NC, USA
October 26-October 28
ISBN: 0-7803-8581-0
To solve the transmission bottleneck inside ATE systems, we developed a high-speed parallel CMOS interface macro, which is flexibly applicable to ASICs in ATE systems. The interface macro is capable of providing up to 16 TX and/or RX channels: Moreover, multiple macros can be implemented to one chip. The interface macro is capable of transmitting from DC to 34.1Gbps (2.13Gbps x 16 channels). In order to achieve ultra-low BER, we have developed a low-jitter digital delay locked loop circuit as a 4-phase clock source for SerDes circuits. This solution yields 1.5ps rms of random jitter. The random jitter of this macro is less than one-eighth of the interface using PLL. The eye-opening reaches 0.7UI at BER=10^-19
Citation:
Daisuke Watanabe, Masakatsu Suda, Toshiyuki Okayasu, "34.1Gbps Low Jitter, Low BER High-Speed Parallel CMOS Interface for Interconnections in High-Speed Memory Test System," itc, pp.1255-1262, International Test Conference 2004 (ITC'04), 2004