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International Test Conference 2004 (ITC'04)
CMOS IC diagnostics using the luminescence of OFF-state leakage currents
Charlotte, NC, USA
October 26-October 28
ISBN: 0-7803-8581-0
ASCII Text
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Stas Polonsky, Keith A. Jenkins, Alan Weger, Shinho Cho, "CMOS IC diagnostics using the luminescence of OFF-state leakage currents," Test Conference, International, pp. 134-139, International Test Conference 2004 (ITC'04), 2004.
 
 
BibTex
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@article{ 10.1109/ITC.2004.49,
author = {Stas Polonsky and Keith A. Jenkins and Alan Weger and Shinho Cho},
title = {CMOS IC diagnostics using the luminescence of OFF-state leakage currents},
journal ={Test Conference, International},
volume = {0},
year = {2004},
issn = {1089-3539},
pages = {134-139},
doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.49},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Test Conference, International
TI - CMOS IC diagnostics using the luminescence of OFF-state leakage currents
SN - 1089-3539
SP134
EP139
A1 - Stas Polonsky,
A1 - Keith A. Jenkins,
A1 - Alan Weger,
A1 - Shinho Cho,
PY - 2004
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Stas Polonsky, IBM T.J. Watson Research Center, NY
Keith A. Jenkins, IBM T.J. Watson Research Center, NY
Alan Weger, IBM T.J. Watson Research Center, NY
Shinho Cho, Silla University, S. Korea
The light emission from ever increasing leakage currents in advanced CMOS technologies can now be reliably measured using existing photon detectors. The measurements of this emission provide valuable information about the operation of ICs. In this paper we suggest and experimentally demonstrate the following optical techniques: (1) transient logic state detection, (2) transient device temperature measurement, and (3) signal integrity analysis, including crosstalk and power supply noise measurements.
Citation:
Stas Polonsky, Keith A. Jenkins, Alan Weger, Shinho Cho, "CMOS IC diagnostics using the luminescence of OFF-state leakage currents," itc, pp.134-139, International Test Conference 2004 (ITC'04), 2004
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