loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
International Test Conference 2004 (ITC'04)
CAEN-BIST: Testing the NanoFabric
Charlotte, NC, USA
October 26-October 28
ISBN: 0-7803-8581-0
ASCII Text
x 
 
Jason G. Brown, R. D. (Shawn) Blanton, "CAEN-BIST: Testing the NanoFabric," Test Conference, International, pp. 462-471, International Test Conference 2004 (ITC'04), 2004.
 
 
BibTex
x
 
@article{ 10.1109/ITC.2004.47,
author = {Jason G. Brown and R. D. (Shawn) Blanton},
title = {CAEN-BIST: Testing the NanoFabric},
journal ={Test Conference, International},
volume = {0},
year = {2004},
issn = {1089-3539},
pages = {462-471},
doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.47},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Test Conference, International
TI - CAEN-BIST: Testing the NanoFabric
SN - 1089-3539
SP462
EP471
A1 - Jason G. Brown,
A1 - R. D. (Shawn) Blanton,
PY - 2004
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Jason G. Brown, Carnegie Mellon University, Pittsburgh PA
R. D. (Shawn) Blanton, Carnegie Mellon University, Pittsburgh PA
A built-in self-test algorithm is developed for chemically-assembled electronic nanotechnology (CAEN) that exploits reconfigurability to achieve 100% fault coverage and nearly 100% diagnostic accuracy. This algorithm is particularly suited for regular architectures with high defect densities.
Citation:
Jason G. Brown, R. D. (Shawn) Blanton, "CAEN-BIST: Testing the NanoFabric," itc, pp.462-471, International Test Conference 2004 (ITC'04), 2004
Usage of this product signifies your acceptance of the Terms of Use.