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International Test Conference 2004 (ITC'04)
AUTOMATIC LINEARITY (IP3) TEST WITH BUILT-IN PATTERN GENERATOR AND ANALYZER
Charlotte, NC, USA
October 26-October 28
ISBN: 0-7803-8581-0
ASCII Text
x 
 
Foster Dai, Charles Stroud, Dayu Yang, Shuying Qi, "AUTOMATIC LINEARITY (IP3) TEST WITH BUILT-IN PATTERN GENERATOR AND ANALYZER," Test Conference, International, pp. 271-280, International Test Conference 2004 (ITC'04), 2004.
 
 
BibTex
x
 
@article{ 10.1109/ITC.2004.41,
author = {Foster Dai and Charles Stroud and Dayu Yang and Shuying Qi},
title = {AUTOMATIC LINEARITY (IP3) TEST WITH BUILT-IN PATTERN GENERATOR AND ANALYZER},
journal ={Test Conference, International},
volume = {0},
year = {2004},
issn = {1089-3539},
pages = {271-280},
doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.41},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Test Conference, International
TI - AUTOMATIC LINEARITY (IP3) TEST WITH BUILT-IN PATTERN GENERATOR AND ANALYZER
SN - 1089-3539
SP271
EP280
A1 - Foster Dai,
A1 - Charles Stroud,
A1 - Dayu Yang,
A1 - Shuying Qi,
PY - 2004
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Foster Dai, Auburn University, Auburn, AL
Charles Stroud, Auburn University, Auburn, AL
Dayu Yang, Auburn University, Auburn, AL
Shuying Qi, Auburn University, Auburn, AL
We present a Built-In Self-Test (BIST) approach based on direct digital synthesizer (DDS) for functionality testing of analog circuitry in mixed-signal systems. Of particular interest, and a main contribution of this paper, is the BIST-based hardware implementation and measurement of amplifier linearity (IP3) test using DDS. The approach described in this paper has been implemented in Verilog and synthesized into FPGAs where it was used for functional testing and compared to simulation results.
Citation:
Foster Dai, Charles Stroud, Dayu Yang, Shuying Qi, "AUTOMATIC LINEARITY (IP3) TEST WITH BUILT-IN PATTERN GENERATOR AND ANALYZER," itc, pp.271-280, International Test Conference 2004 (ITC'04), 2004
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