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International Test Conference 2004 (ITC'04)
Charlotte, NC, USA
October 26-October 28
ISBN: 0-7803-8581-0
ASCII Text
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Robert Madge, "ATE Value Add through Open Data Collection," Test Conference, International, pp. 1430, International Test Conference 2004 (ITC'04), 2004.
 
 
BibTex
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@article{ 10.1109/ITC.2004.38,
author = {Robert Madge},
title = {ATE Value Add through Open Data Collection},
journal ={Test Conference, International},
volume = {0},
year = {2004},
issn = {1089-3539},
pages = {1430},
doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.38},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Test Conference, International
TI - ATE Value Add through Open Data Collection
SN - 1089-3539
SP
EP
A1 - Robert Madge,
PY - 2004
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Robert Madge, LSI Logic
The exponential rising cost of semiconductor manufacturing has finally caused a slowing of Moore?s law. The industry is responding with platform ASICs, FPGAs and mask shuttles for lowering cost. In this environment, semiconductor test cannot afford to continue in an ever-increasing cost spiral as a limited-value added quality step in the flow.
Citation:
Robert Madge, "ATE Value Add through Open Data Collection," itc, pp.1430, International Test Conference 2004 (ITC'04), 2004
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