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International Test Conference 2004 (ITC'04)
A Real-Time Jitter Measurement Board for High-Performance Computer and Communication Systems
Charlotte, NC, USA
October 26-October 28
ISBN: 0-7803-8581-0
ASCII Text
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Takahiro J. Yamaguchi, Masahiro Ishida, Kiyotaka Ichiyama, Mani Soma, Krawinkel Christian, Katsuaki Ohsawa, Masao Sugai, "A Real-Time Jitter Measurement Board for High-Performance Computer and Communication Systems," Test Conference, International, pp. 77-84, International Test Conference 2004 (ITC'04), 2004.
 
 
BibTex
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@article{ 10.1109/ITC.2004.21,
author = {Takahiro J. Yamaguchi and Masahiro Ishida and Kiyotaka Ichiyama and Mani Soma and Krawinkel Christian and Katsuaki Ohsawa and Masao Sugai},
title = {A Real-Time Jitter Measurement Board for High-Performance Computer and Communication Systems},
journal ={Test Conference, International},
volume = {0},
year = {2004},
issn = {1089-3539},
pages = {77-84},
doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.21},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Test Conference, International
TI - A Real-Time Jitter Measurement Board for High-Performance Computer and Communication Systems
SN - 1089-3539
SP77
EP84
A1 - Takahiro J. Yamaguchi,
A1 - Masahiro Ishida,
A1 - Kiyotaka Ichiyama,
A1 - Mani Soma,
A1 - Krawinkel Christian,
A1 - Katsuaki Ohsawa,
A1 - Masao Sugai,
PY - 2004
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Takahiro J. Yamaguchi, Advantest Laboratories, Ltd., Sendai, Miyagi, Japan
Masahiro Ishida, Advantest Laboratories, Ltd., Sendai, Miyagi, Japan
Kiyotaka Ichiyama, Advantest Laboratories, Ltd., Sendai, Miyagi, Japan
Mani Soma, University of Washington, Seattle, WA
Krawinkel Christian, Advantest Corporation, Gunma, Japan
Katsuaki Ohsawa, Advantest Corporation, Gunma, Japan
Masao Sugai, Advantest Corporation, Gunma, Japan
This paper presents the design and performance results of a real-time jitter measurement board for testing high-frequency clocks and data transceivers. The board targets high-volume manufacturing test to measure sinusoidal jitter tolerance and random jitter in computer and communication systems, with a substantial reduction in test cost compared to existing equipment.
Citation:
Takahiro J. Yamaguchi, Masahiro Ishida, Kiyotaka Ichiyama, Mani Soma, Krawinkel Christian, Katsuaki Ohsawa, Masao Sugai, "A Real-Time Jitter Measurement Board for High-Performance Computer and Communication Systems," itc, pp.77-84, International Test Conference 2004 (ITC'04), 2004
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