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International Test Conference 2004 (ITC'04)
Transfer Functions For The Reference Clock Jitter In A Serial Link: Theory And Applications
Charlotte, NC, USA
October 26-October 28
ISBN: 0-7803-8581-0
Mike Li, Wavecrest, Technology Dr., San Jose, CA
Andy Martwick, Intel, Folsom, CA
Gerry Talbot, AMD, MA
Jan Wilstrup, Teradyne Inc., Fridley, MN
Transfer functions for the reference clock jitter in a serial link such as the PCI Express 100 MHz reference clock are established for various clock and data recovery circuits (CDRCs). In addition, mathematical interrelationships between phase, period, and cycle-to-cycle jitter are established and phase jitter is used with the jitter transfer function. Numerical simulations are carried out for these transfer functions. Relevant eye-closure/total jitter at a certain bit error rate (BER) level for the receiver is estimated by applying these jitter transfer functions to the measured phase jitter of the reference clock over a range of transfer function parameters. Implications of this new development to serial link reference clock testing and specification formulation are discussed.
Citation:
Mike Li, Andy Martwick, Gerry Talbot, Jan Wilstrup, "Transfer Functions For The Reference Clock Jitter In A Serial Link: Theory And Applications," itc, pp.1158-1167, International Test Conference 2004 (ITC'04), 2004
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