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International Test Conference 2004 (ITC'04)
Charlotte, NC, USA
October 26-October 28
ISBN: 0-7803-8581-0
ASCII Text
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Tom Storey, "Testing in a high volume DSM Environment," Test Conference, International, pp. 1422, International Test Conference 2004 (ITC'04), 2004.
 
 
BibTex
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@article{ 10.1109/ITC.2004.184,
author = {Tom Storey},
title = {Testing in a high volume DSM Environment},
journal ={Test Conference, International},
volume = {0},
year = {2004},
issn = {1089-3539},
pages = {1422},
doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.184},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Test Conference, International
TI - Testing in a high volume DSM Environment
SN - 1089-3539
SP
EP
A1 - Tom Storey,
PY - 2004
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Tom Storey, BAE Systems Manassas, VA
Today?s test strategy options have become plentiful and diverse. Increasingly the correct approach is the one that reflects most accurately the business environment under which the product has been manufactured and tested. It is important, therefore, to first understand what factors are and will be dominating semiconductor manufacturing in the 90nm and lower technologies ahead.
Citation:
Tom Storey, "Testing in a high volume DSM Environment," itc, pp.1422, International Test Conference 2004 (ITC'04), 2004
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